Failure Analysis for Semiconductor Engineers

Revision as of 06:42, 18 February 2009 by Jmtirao (talk | contribs) (Redirecting to NEC Seminars)
(diff) ← Older revision | Latest revision (diff) | Newer revision → (diff)

Redirect page

Redirect to:

This training is designed to familiarize the participants from the semiconductor industry with the basic tools and procedures of failure analysis which are necessary to arrive effectively at the root cause of the failure. A discussion of the common mechanisms in the failure of microelectronic components will further help the participant correctly interpret the findings of the analysis so as to come up with valid conclusions about the most likely cause of the failure.